スポンサーリンク
Department of Precision Science and Technology, School of Engineering, Osaka University | 論文
- Characterization of Patterned Oxide Buried in Bonded Silicon-on-Insulator Wafers by Near-Infrared Scattering Topography and Microscopy
- C-12-5 Methodology for Layout-Based Diagnosis of VLSI Chips Considering Temperature Distribution