YANAGIDA Hiroaki | Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo
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Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo | 論文
- Structural and Chemical State Analysis of the Heat-Treated Au/GaSb(110) Interface by Means of Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS)
- Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) Effects
- Chemical State Analysis of Silicon-Oxygen Compounds : CHEMICAL APPLICATIONS
- Data Processing in High Resolution X-Ray Spectroscopy : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
- Measurements of Plasma Parameters in a High-Frequency Glow Discharge Using the Orifice Probe