SHIN D. | Semiconductor R&D Center, Samsung Electronics Co.
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概要
Semiconductor R&D Center, Samsung Electronics Co. | 論文
- Dynamic Data Retention Degradation in FD-SOI DRAM Cells Due to Source-Induced Charge Accumulation(SICA) Effect
- THE INFLUENCE OF INTEGRATION PROCESS ON THE IMPRINT IN PT-PZT-PT FERROELECTRIC CAPACITORS
- Design Considerations for Patterned Wafer Bonding