Kitamura Takafumi | Silicon Technology R&D Center, Sumitomo Sitix Corporation
スポンサーリンク
概要
関連著者
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Miyazaki Shuji
Department Of Electrical And Information Engineering Faculty Of Engineering Yamagata University
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Kitamura Takuya
Department Of Physical Electronics Tokyo Institute Of Technology
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MIYAZAKI Morimasa
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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MIYAZAKI Sumio
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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KITAMURA Takafumi
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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Kitamura T
Murata Mfg. Co. Ltd. Kyoto Jpn
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Miyazaki M
Silicon Technology R&d Center Sumitomo Sitix Corporation
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Kitamura Takafumi
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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Miyazaki Morimasa
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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Miyazaki Sumio
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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Ono Toshiaki
Research And Development Center Sumitomo Sitix Corporation
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Ochiai T
Research And Development Center Sumitomo Sitix Corporation
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YANASE Yoshio
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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OCHIAI Takashi
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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TSUYA Hideki
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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SHIGEMATSU Tatsuhiko
Silicon Technology R&D Center, Sumitomo Sitix Corporation
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HOURAI Masataka
Silicon Technology R & D Center, Sumitomo Sitix Corporation
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Yanase Yoshio
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
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Aoki Toshihiko
Silicon Technology Center Sumitomo Sitix Corporation
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Nakashima Yutaka
Silicon Technology Center, Sumitomo Sitix Corporation
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Hourai Masataka
Silicon Technology Center Sumitomo Sitix Corporation
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Shigematsu T
Silicon Technology R&d Center Sumitomo Sitix Corporation
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Tsuya H
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
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Nakashima Yutaka
Silicon Technology Center Sumitomo Sitix Corporation
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SHIGEMATSU Tatsuhiko
Silicon Technology Center, Sumitomo Sitix Corp.
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TSUYA Hideki
Silicon Technology R & D Center, Sumitomo Sitix Corporation
著作論文
- Influence of Crystal-Originated "Particle" Microstructure on Silicon Wafers on Gate Oxide Integrity
- Influence of Fe Contamination in Czochralski-Grown Silicon Single Crystals on LSI-Yield Related Crystal Quality Characteristics