Bekki Naoaki | College of Engineering, Nihon University, Koriyama, Fukushima 963-8642, Japan
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- College of Engineering, Nihon University, Koriyama, Fukushima 963-8642, Japanの論文著者
College of Engineering, Nihon University, Koriyama, Fukushima 963-8642, Japan | 論文
- Characterization of Sol–Gel Derived and Crystallized ZrO2 Thin Films
- Temperature-Programmed Desorption Analyses of Sol–Gel Deposited and Crystallized HfO2 Films
- Schottky-barrier-induced AC surface photovoltages in Au-precipitated n-type Si(001) surfaces
- Erratum: ``Schottky-Barrier-Induced AC Surface Photovoltages in Au-Precipitated n-Type Si(001) Surfaces''
- Anomalous Oxide Charge Variation Identified by Alternating Current Surface Photovoltage Method in Cr-Aqueous-Solution-Rinsed p-Type Si(001) Wafers Exposed to Air