Noh Hunhee | School of Electrical Engineering, Seoul National University, Shillim-dong, kwanak-gu, Seoul 151-742, Korea
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- School of Electrical Engineering, Seoul National University, Shillim-dong, kwanak-gu, Seoul 151-742, Koreaの論文著者
School of Electrical Engineering, Seoul National University, Shillim-dong, kwanak-gu, Seoul 151-742, Korea | 論文
- Gate Length Reduction Technology for Pseudomorphic In0.52Al0.48As/In0.7Ga0.3As High Electron Mobility Transistors
- High Electron Mobility Transistors Yield Improvement with Ultrasonically Assisted Recess for High-Speed Integrated Circuits
- High Performance 0.1 μm GaAs Pseudomorphic High Electron Mobility Transistors with Si Pulse-Doped Cap Layer for 77 GHz Car Radar Applications