SAITO Toshimichi | College of Engineering, Hosei University

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College of Engineering, Hosei University | 論文

• Model Calculation of the Damage Rate Dependence of Yield Stress Change in an Irradiated Fe-Cu Model Alloy
• Redundancy Technique for Ultra-High-Speed Static RAMs
• Process and Device Technologies for High Speed Self-Aligned Bipolar Transistors
• Analysis of Dielectric Hollow Slab Waveguides Using the Finite-Difference Beam-Propagation Method
• Polarization Dependence of Pure Bending Loss in Slab Optical Waveguides

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