Oshikubo Hiromichi | Texas Instruments Japan, Miho, Ibaraki 300-0496, Japan
スポンサーリンク
概要
関連著者
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Sugawa Shigetoshi
Graduate School Of Engineering Tohoku University
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Akahane Nana
Graduate School Of Engineering Tohoku University
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Mizobuchi Koichi
Texas Instruments Japan, Miho, Ibaraki 300-0496, Japan
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Adachi Satoru
Texas Instruments Japan, Miho, Ibaraki 300-0496, Japan
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Oshikubo Hiromichi
Texas Instruments Japan, Miho, Ibaraki 300-0496, Japan
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Lee Woonghee
Graduate School Of Engineering Tohoku University
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Akahane Nana
Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
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Tejada Jose
Texas Instruments Japan, Miho, Ibaraki 300-0496, Japan
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Lee Woonghee
Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
著作論文
- A Very Low Dark Current Temperature-Resistant, Wide Dynamic Range, Complementary Metal Oxide Semiconductor Image Sensor
- High Sensitivity Dynamic Range Enhanced Complementary Metal–Oxide–Semiconductor Imager with Noise Suppression