Devolder Thibaut | Institut d'Electronique Fondamentale, UMR 8622 CNRS, Université Paris Sud, Bâtiment 220, 91405 Orsay, France

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Devolder Thibaut
Institut d'Electronique Fondamentale, UMR 8622 CNRS, Université Paris Sud, Bâtiment 220, 91405 Orsay, France
Yuasa Shinji
National Inst. Advanced Industrial Sci. And Technol.(aist) Ibaraki Jpn
Fukushima Akio
National Institute Of Advanced Industrial Science And Technology
Suzuki Yoshishige
Graduate School Of Engineering Science Osaka University
Kubota Hitoshi
National Inst. Advanced Industrial Sci. And Technol. (aist) Tsukuba Jpn
Chappert Claude
Institut d'Electronique Fondamentale, UMR 8622 CNRS, Université Paris Sud, Bâtiment 220, 91405 Orsay, France
Yagami Kojiro
SSNC, Semiconductor Technology Development Group, Sony Corp., Atsugi, Kanagawa 243-0014, Japan
Tulapurkar Ashwin
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
Devolder Thibaut
Institut d'Electronique Fondamentale, UMR 8622 CNRS, Université Paris Sud, Bâtiment 220, 91405 Orsay, France
Crozat Paul
Institut d'Electronique Fondamentale, UMR 8622 CNRS, Université Paris Sud, Bâtiment 220, 91405 Orsay, France
Crozat Paul
Institut d'Electronique Fondamentale, UMR 8622 CNRS, Université Paris Sud, Bâtiment 220, 91405 Orsay, France
Devolder Thibaut
Institut d'Electronique Fondamentale, Université Paris-Sud, 91405 Orsay, France and UMR 8622, CNRS, 91405 Orsay, France
Suzuki Yoshishige
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
Yuasa Shinji
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
Kubota Hitoshi
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan

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