Jeon Byung-Hoon | Division of Electronics and Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Korea
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概要
- Jeon Byung-Hoonの詳細を見る
- 同名の論文著者
- Division of Electronics and Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Koreaの論文著者
関連著者
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Jeon Byung-Hoon
Division of Electronics and Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Korea
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Tuan Do
Division of Electronics and Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Korea
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Tuan Do
Division of Electronics Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Korea
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Jeon Byung-Hoon
Division of Electronics Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Korea
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LAN Phan
Division of Electronics and Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Korea
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Hien Pham
Division of Electronics and Electrical Engineering, Dongguk University, Seoul 100-715, Republic of Korea
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Tuan Do
Faculty of Electronics and Electrical Engineering, Hung Yen University of Technology and Education, Khoai Chau, Hung Yen, Vietnam
著作論文
- Electron Collision Cross Sections for the Cl2 Molecule from Electron Transport Coefficients
- Determination of Electron Collision of Cross-Sections for the H2 Molecule for Plasma Discharge Simulation
- Electron Collision Cross Sections for the Tetraethoxysilane Molecule and Electron Transport Coefficients in Tetraethoxysilane--O2 and Tetraethoxysilane--Ar Mixtures
- Electron Collision Cross Sections for the BF