Ohji Yuzuru | Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japan

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概要

• Ohji Yuzuruの詳細を見る
• 同名の論文著者
• Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japanの論文著者

関連著者

• Watanabe Toshinari

  Semiconductor Leading Edge Technol. Inc. Ibaraki Jpn

• Eimori Takahisa

  Semiconductor Leading Edge Technologies Inc.

• Matsuki Takeo

  Semiconductor Leading Edge Technologies Inc. (selete)

• Ohji Yuzuru

  Semiconductor & Integrated Circuits Division Hitachi Ltd.

• Nara Yasuo

  Semiconductor Leading Edge Technologies Inc.

• Miura Takayoshi

  Semiconductor Leading Edge Technologies Inc. (selete)

• Uedono Akira

  Graduate School of Pure and Applied Science, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan

• Mise Nobuyuki

  Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japan

• Yamada Keisaku

  Nano Technology Research Laboratory, Waseda University, Shinjuku, Tokyo 16-0041, Japan

• Eimori Takahisa

  Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japan

• Mise Nobuyuki

  Semiconductor Leading Edge Technologies, Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Ohji Yuzuru

  Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japan

• Miura Takayoshi

  Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japan

• Nara Yasuo

  Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japan

• Watanabe Toshinari

  Semiconductor Leading Edge Technologies, Inc., Tsukuba, Ibaraki 305-8569, Japan

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著作論文

• Impact of High Temperature Annealing on Traps in Physical-Vapor-Deposited-TiN/SiO2/Si Analyzed by Positron Annihilation

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