Shobatake Kosuke | Department of Molecular Design and Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan
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概要
- Shobatake Kosukeの詳細を見る
- 同名の論文著者
- Department of Molecular Design and Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japanの論文著者
関連著者
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Sakai Hiroaki
Materials Research Laboratory Ngk Insulators Ltd.
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Akiyama Keijiro
Department Of Molecular Design And Engineering Graduate School Of Engineering Nagoya University
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Sawabe Kyoichi
Department Of Molecular Design And Engineering Graduate School Of Engineering Nagoya University
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Watanabe Morimichi
Materials Research Laboratory Ngk Insulators Ltd.
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Ishikawa Takahiro
Materials Research Laboratory Ngk Insulators Ltd.
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Iida Takashi
Departmenr Of Neuropathology Neurological Institute Graduate School Of Medical Sciences Kyushu Unive
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Shobatake Kosuke
Department Of Functional Molecular Science The Graduate University For Advanced Studies And Institute For Molecular Science
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Shobatake Kosuke
Department of Molecular Design and Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan
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Akiyama Keijiro
Department of Molecular Design and Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan
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Narita Shogo
Department Of Molecular Design And Engineering Graduate School Of Engineering Nagoya University
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Sakai Hiroaki
Materials Research Laboratory, NGK INSULATORS, LTD., 2-56 Suda-cho, Mizuho, Nagoya 467-8530, Japan
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Sawabe Kyoichi
Department of Molecular Design and Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan
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Iida Takashi
Department of Molecular Design and Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan
著作論文
- Thermal Desorption Behavior of AlF3 Formed on Al2O3
- Identification of Desorption Products from the Thermal Reaction of AlN with XeF2 Vapor Using Molecular Beam Mass Spectrometry and a Time-of-Flight Technique