Shie Wun-Yi | Department of Electrical Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.
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概要
- Shie Wun-Yiの詳細を見る
- 同名の論文著者
- Department of Electrical Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.の論文著者
関連著者
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Liu Don-gey
Department Of Electronic Engineering Feng Chia University
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Shie Wun-Yi
Department of Electrical Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.
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Liang Bau-Jy
Department of Electrical Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.
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Liang Bau-jy
Department Of Electronic Engineering Feng Chia University
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Chang Chih-yuan
Department Of Automation Engineering Kao Yuan Institute Of Technology
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Chang Chih-Yuan
Department of Electrical Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.
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Liu Don-Gey
Department of Electronic Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.
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Bau-Jy Liang
Department of Electrical Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.
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Sy-Ruen Huang
Department of Electrical Engineering, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung, Taiwan 40724, R.O.C.
著作論文
- Effects of Concentration of Nanoscale Tin-Doped Indium Oxide on Electrical Breakdown of High-Resistance Liquid Crystal
- Effects of Nanoscaled Tin-Doped Indium Oxide on the Image Sticking Property of Liquid Crystal Cells