Tan Wei-Sin | Sharp Laboratories of Europe Ltd, Edmund Halley Road, Oxford Science Park, Oxford, OX4 4GB, United Kingdom
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概要
- Tan Wei-Sinの詳細を見る
- 同名の論文著者
- Sharp Laboratories of Europe Ltd, Edmund Halley Road, Oxford Science Park, Oxford, OX4 4GB, United Kingdomの論文著者
関連著者
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Takahashi Koji
Advanced Technology Research Laboratories Sharp Corporation
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Tan Wei-Sin
Sharp Laboratories of Europe Ltd, Edmund Halley Road, Oxford Science Park, Oxford, OX4 4GB, United Kingdom
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BOUSQUET Valerie
Sharp Laboratories of Europe Ltd.
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KAUER Matthias
Sharp Laboratories of Europe Ltd.
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Kauer Matthias
Advanced Technology Research Laboratories Sharp Corporation
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Tsuda Yuhzoh
Electronic Components And Devices Group Sharp Corporation
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Tan Wei-sin
Sharp Laboratories Of Europe Ltd.
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Bousquet Valerie
Advanced Technology Research Laboratories Sharp Corporation
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Takahashi Koji
Advanced Technology Research Laboratories, Sharp Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632
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Ariyoshi Akira
Electronic Components and Devices Group, Sharp Corporation, 247 Soujo, Nutanishi-cho, Mihara, Hirosh
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Ohta Masataka
Electronic Components and Devices Group, Sharp Corporation, 247 Soujo, Nutanishi-cho, Mihara, Hirosh
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Ohta Masataka
Electronic Components And Devices Group Sharp Corporation
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Ariyoshi Akira
Electronic Components And Devices Group Sharp Corporation
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Heffernan Jonathan
Sharp Laboratories of Europe Ltd, Edmund Halley Road, Oxford Science Park, Oxford, OX4 4GB, United Kingdom
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Takahashi Koji
Advanced Technology Research Laboratories, Sharp Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Bousquet Valerie
Sharp Laboratories of Europe Ltd, Edmund Halley Road, Oxford Science Park, Oxford, OX4 4GB, United Kingdom
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Kauer Matthias
Sharp Laboratories of Europe Ltd, Edmund Halley Road, Oxford Science Park, Oxford, OX4 4GB, United Kingdom
著作論文
- Blue-Violet Inner Stripe Laser Diodes Using Lattice Matched AlInN as Current Confinement Layer for High Power Operation
- InGaN-Based Blue-Violet Laser Diodes Using AlN as the Electrical Insulator