Odaka Hidefumi | Research Center, Asahi Glass Co., Ltd., Yokohama 221-8755, Japan
スポンサーリンク
概要
関連著者
-
Odaka Hidefumi
Research Center, Asahi Glass Co., Ltd., Yokohama 221-8755, Japan
-
Ikeda Toru
Research Group Of Regional Sciences Graduate School Of Letters Hokkaido University
-
Ogi Hirotsugu
Graduate School Of Engineering Science Osaka University
-
Hirao Masahiko
Graduate School Of Engineering Sci. Osaka Univ.
-
Shidoji Eiji
Research Center Asahi Glass Co. Ltd.
-
Sichanugrist Porponth
Department Of Physical Electronics Tokyo Institute Of Technology
-
Konagai Makoto
Department Of Electrical & Electronic Engineering Tokyo Institute Of Technology
-
Shagawa Tomohiro
Graduate School Of Engineering Science Osaka University
-
Nakamura Nobutomo
Graduate School Of Engineering Science Osaka University
-
Kihara Naoto
Research Center, Asahi Glass Co., Ltd., Yokohama 221-8755, Japan
-
Hirao Masahiko
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
-
Nakamura Nobutomo
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
-
Shagawa Tomohiro
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
-
Isshiki Masanobu
Research Center, Asahi Glass Co., Ltd., Yokohama 221-8755, Japan
-
Okubo Junichi
Research Center, Asahi Glass Co., Ltd., Yokohama 221-8755, Japan
-
Oyama Takuji
Research Center, Asahi Glass Co., Ltd., Yokohama 221-8755, Japan
著作論文
- Improving Mobility of F-Doped SnO Thin Films by Introducing Temperature Gradient during Low-Pressure Chemical Vapor Deposition
- Elastic-Constant Measurement in Oxide and Semiconductor Thin Films by Brillouin Oscillations Excited by Picosecond Ultrasound