Jea-Gun Park | Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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概要
- Jea-Gun Park の詳細を見る
- 同名の論文著者
- Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Koreaの論文著者
関連著者
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Jea-Gun Park
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Moon Byeong-Sam
R&D Division, Hynix Semiconductor Inc., Icheon, Kyoungkido 467-701, Korea
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Jung-Mi Oh
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Kim Seong-Je
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Oh Jung-Mi
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Shim Tae-Hun
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Jea-gun Park
Advanced Semiconductor Material and Devices Development Center, Hanyang University, Seoul 133-791, Korea
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Tae-Hun Shim
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Seong-Je Kim
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Bo-Young Lee
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Kim Kwang-Salk
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Kang Hee-Bok
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Hee-Bok Kang
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Byeong-sam Moon
R&D Division, Hynix Semiconductor Inc., Icheon, Kyoungkido 467-701, Korea
著作論文
- Optimal Channel Ion Implantation for High Memory Margin of Capacitor-Less Memory Cell Fabricated on Fully Depleted Silicon-on-Insulator
- Effects of Bulk Microdefects and Metallic Impurities on p–n Junction Leakage Currents in Silicon