Moon Byeong-Sam | R&D Division, Hynix Semiconductor Inc., Icheon, Kyoungkido 467-701, Korea
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概要
関連著者
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Moon Byeong-Sam
R&D Division, Hynix Semiconductor Inc., Icheon, Kyoungkido 467-701, Korea
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Park Jea-gun
Advanced Semiconductor Material & Device Development Center Hanyang University
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Sim Bok-Cheol
Growing Technology Development Team, Siltron, Gumi, Gyeongbuk 730-340, Korea
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Jea-Gun Park
Advanced Semiconductor Material and Device Development Center, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea
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Jea-gun Park
Advanced Semiconductor Material and Devices Development Center, Hanyang University, Seoul 133-791, Korea
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Bo-Young Lee
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Kim Kwang-Salk
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Kang Hee-Bok
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Hee-Bok Kang
EPI Business Unit, Siltron Inc., Gumi, Gyeongbuk 730-340, Korea
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Byeong-sam Moon
R&D Division, Hynix Semiconductor Inc., Icheon, Kyoungkido 467-701, Korea
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Moon Byeong-Sam
R&D Division, Hynix Semiconductor Inc., Icheon, Kyoungkido 467-701, Korea
著作論文
- Micro Defect Size in Si Single Crystal Grown by Czochralski Method
- Effects of Bulk Microdefects and Metallic Impurities on p–n Junction Leakage Currents in Silicon