Liu Mark | Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu 300, Taiwan

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関連著者

Hsieh Tsung-eong
Department Of Materials Science And Engineering National Chiao Tung University
Liu Mark
Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu 300, Taiwan
Hsieh Tsung-Eong
Department of Material Science and Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
Tsai Yu-sheng
Institute Of Electro-optical And Materials Science National Formosa University
Juang Fuh-shyang
Institute Of Electro-optical And Materials Science National Formosa University
Chang Ming-Hua
Department of Materials Science and Engineering, National Chiao-Tung University, Hsinchu 30010, Taiwan
Chu Wei-Ping
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 63208, Taiwan
Tang Rong-Ming
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 63208, Taiwan
Chang Ming-Hua
Department of Material Science and Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
Juang Fuh-Shyang
Institute of Electo-optical and Materials Science, National Formosa University, 64 Wunhua Road, Huwei, Yunlin 632-08, Taiwan
Tsai Yu
Institute Of Electro-optical And Materials Science National Formosa Univ.
Chen Wen-ray
Department Of Electronic Engineering National Formosa University
Huang Bohr-ran
Graduate School Of Engineering Science And Technology National Yunlin University Of Science And Tech
Su Yan-kuin
Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio
Hsieh Tsung-Eong
Department of Materials Science and Engineering, National Chiao-Tung University, Hsinchu 30010, Taiwan
Chung Ming-Hua
Department of Material Science and Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan
Wang Shun-Hsi
Institute of Electro-optical and Materials Science, National Formosa University, Huwei, Yunlin 632, Taiwan
Wang Shun-Hsi
Institute of Electro-optical and Materials Science, National Formosa University, 64 Wunhua Road, Huwei, Yunlin 632-08, Taiwan
Huang Jian-Ji
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
Hsieh Huai-En
Graduate School of Optoelectronics Engineering, National Yunlin University of Science and Technology, Yunlin 640, Taiwan
Tsai Yu-Sheng
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 632, Taiwan
Tsai Yu
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 63208, Taiwan
Chen Chen-Ming
Department of Material Science and Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan
Juang Fuh-Shyung
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 63208, Taiwan
Chen Wen-Ray
Department of Electrical Engineering, Southern Taiwan University of Technology, Tainan 710, Taiwan, R.O.C.
Huang Bohr-Ran
Graduate Institute of Electro-Optical Engineering and Department of Electronic Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan
Chen Wen-Ray
Department of Electronic Engineering, National Formosa University, Huwei, Yunlin 632, Taiwan
Juang Fuh-Shyang
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 632, Taiwan
Juang Fuh-Shyang
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 63208, Taiwan
Su Yan-Kuin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan

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