MIZUNO Tomohisa | ULSI Research Laboratories, TOSHIBA Corporation

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概要

• MIZUNO Tomohisaの詳細を見る
• 同名の論文著者
• ULSI Research Laboratories, TOSHIBA Corporationの論文著者

ULSI Research Laboratories, TOSHIBA Corporation | 論文

• Two Correlated Mechanisms in Thin SiO_2 Breakdown
• Reliability of Structurally Modified Ultra-Thin Gate Oxides
• An Improved Bandgap Narrowing Model Based on Corrected Intrinsic Carrier Concentration
• Observation of Oxide-Thickness-Dependent Interface Roughness in Si MOS Structure
• Observation of Oxide Thickness Dependent Interface Roughness in Si MOS Structure

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