Cheng Osbert | United Microelectronics Corp. (UMC), CRD Logic Division, No. 18, Nanke 2nd Rd., Tainan Science Park, Sinshih Township, Tainan County 741, Taiwan 12457, R.O.C.
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- United Microelectronics Corp. (UMC), CRD Logic Division, No. 18, Nanke 2nd Rd., Tainan Science Park, Sinshih Township, Tainan County 741, Taiwan 12457, R.O.C.の論文著者
United Microelectronics Corp. (UMC), CRD Logic Division, No. 18, Nanke 2nd Rd., Tainan Science Park, Sinshih Township, Tainan County 741, Taiwan 12457, R.O.C. | 論文
- New Negative-Bias-Temperature-Instability Improvement Using Buffer Layer under Highly Compressive Contact Etch Stop Layer for 45-nm-Node Complementary Metal–Oxide–Semiconductor and Beyond
- Impact of Reducing Shallow Trench Isolation Mechanical Stress on Active Length for 40 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
- A Low Thermal Budget High Performance 0.25-0.18 μm Merged Logic Device and Dynamic Random Access Memory Application