Li Yiming | National Nano Device Labs., Hsinchu, Taiwan

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概要

関連著者

Huang Chun-yang
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
Li Yiming
National Chiao Tung Univ. Hsinchu Twn
Lee Yao-jen
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
Huang Tiao-yuan
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung University
Chao Tien-sheng
Department Of Electrophysics National Chiao Tung University
Lin Horng-chih
National Chiao Tung University
Huang Chun-Yang
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan
Li Yiming
National Nano Device Labs., Hsinchu, Taiwan
Lin Horng-Chih
National Nano Device Labs., Hsinchu, Taiwan

著作論文

Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal–Oxide–Semiconductor Field Effect Transistors

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