Jhou Ze-Wei | Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-Chu 300, Taiwan
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概要
- Jhou Ze-Weiの詳細を見る
- 同名の論文著者
- Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-Chu 300, Taiwanの論文著者
関連著者
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Chen Shuang-Yuan
Institute of Mechatronic Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Lin Jung-Chun
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu 300, Taiwan
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Jhou Ze-Wei
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu 300, Taiwan
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Chou Sam
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu 300, Taiwan
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Ko Joe
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu 300, Taiwan
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Haung Heng-Sheng
Institute of Mechatronics Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Ko Joe
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-Chu 300, Taiwan
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Chou Sam
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-Chu 300, Taiwan
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Jhou Ze-Wei
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-Chu 300, Taiwan
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Haung Heng-Sheng
Institute of Mechatronic Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Lin Jung-Chun
Special Tech. Development Group, ProMOS Technologies, 19, Li-Hsin Road, Science-Based Industrial Park, Hsin-Chu 30078, Taiwan
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Chen Hung-Wen
Institute of Mechatronic Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Lin Hung-Chuan
Institute of Mechatronics Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Lei Tien-Fu
Department of Electronics Engineering, National Chiao Tung University, 1001, Ta-Hsueh Rd., Hsinchu 300, Taiwan
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Chen Shuang-Yuan
Institute of Mechatronics Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Wu Ssu-Han
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-Chu 300, Taiwan
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Tu Chia-Hao
Institute of Mechatronic Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Wang Mu-Chun
Department of Electronics Engineering, Minghsin University of Science and Technology, 1, Hsin-Hsin Rd., Hsin-Feng, Hsin-Chu County 304, Taiwan
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Kao Po-Wei
Institute of Mechatronic Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Lin Memg-Hong
Institute of Mechatronic Engineering, National Taipei University of Technology, 1, Sec. 3, Chung-Hsiao E. Rd., Taipei 106, Taiwan
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Ko Joe
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu City 300, Taiwan
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Chou Sam
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu City 300, Taiwan
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Jhou Ze-Wei
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu City 300, Taiwan
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Lei Tien-Fu
Department of Electronics Engineering, National Chiao Tung University, Hsinchu City 300, Taiwan
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Lin Jung-Chun
Special Technology Division, United Microelectronics Corporation, 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsinchu City 300, Taiwan
著作論文
- Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for n-Channel Metal–Oxide–Semiconductor Field-Effect-Transistor of 0.13 μm Technology
- Mismatches after Hot-Carrier Injection in Advanced Complementary Metal–Oxide–Semiconductor Technology Particularly for Analog Applications
- Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors of 0.13 μm Technology