Yun Sun | Electronic and Telecommunications Research Institute, Daejon 305-350, Korea

Department of Electronic Devices and Materials Technology, State University of Chemistry and Technology, 7 F. Engels St., 153000 Ivanovo, Russia

Department of Control and Instrumentation Engineering, Korea University, Chungnam 339-700, Korea

Department of Biomicrosystem, Korea University, Seoul 136-713, Republic of Korea

Department of Biomicrosystem Technology, Korea University, Seoul 136-701, Korea

Division of Electronic, Computer, and Communication Engineering, Hanseo University, Chungnam 356-706, Korea

Department of Sogang Institute of Advanced Technology (SIAT), Sogang University, Seoul 121-742, Korea

Department of Electronic Engineering, Sogang University, Seoul 121-742, Korea

School of Electrical & Electronic Engineering, Chung-Ang University, 221 Huksuk-Dong, Dongjak-Gu, Seoul 156-756, Korea

Department of Electronic, Computer, and Communication Engineering, Hanseo University, Chungnam 356-706, Korea

Electronics and Telecommunications Research Institute, 161 Gajung-dong, Yusong-gu, Daejon 305-350, Korea

Department of Control and Instrumentation Engineering, Korea University, Chungnam 339-700, Korea

Department of Electronic Engineering, Hanseo University, 360 Daegok-Ri, Haemi-Myun, Seosan-Si, Chung-Nam 356-820, Korea

Department of Electronic Engineering, Sogang University