Lin Hao-Hsiung | Graduate Institute of Electronic Engineering and Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan, Republic of China

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Lin Hao-Hsiung
Graduate Institute of Electronic Engineering and Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan, Republic of China
Liu Day-shan
Institute Of Electro-optical And Materials Science National Formosa University
Sung Li-wei
Graduate Institute Of Electronics Engineering National Taiwan University
Chu Tso-yu
Graduate Institute Of Electronics Engineering National Taiwan University
Lin Hao-Hsiung
Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
Shih Ding-Kang
Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
Yang T.-R.
Department of Physics, National Taiwan Normal University, Taipei, Taiwan, R.O.C.
Liu Day-Shan
Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Taiwan, Republic of China
Lee Chi-Sen
Graduate Institute of Electronics Engineering, National Taiwan University, Taipei 106, Taiwan, Republic of China
Chang Fu-Yu
Graduate Institute of Electronic Engineering and Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan, Republic of China
Lee Chi-Sen
Graduate Institute of Electronic Engineering and Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan, Republic of China
Chu Tso-Yu
Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
Sung Li-Wei
Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.

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