Sundaravel B. | Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology, Clear Water Bay
スポンサーリンク
概要
- 同名の論文著者
- Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology, Clear Water Bayの論文著者
関連著者
-
Wong C
Materials Characterization And Preparation Facility Hong Kong University Of Science And Technology
-
Wong S.k.
Materials Characterization And Preparation Facility Hong Kong University Of Science And Technology
-
Wong C.y.
Materials Characterization And Preparation Facility Hong Kong University Of Science And Technology
-
Xu J.b.
Department Of Electronic Engineering The Chinese University Of Hong Kong
-
Wilson I.h.
Department Of Electronic Engineering The Chinese University Of Hong Kong
-
Pakhomov A
Materials Characterisation And Preparation Facility Hong Kong University Of Science And Technology
-
Luo E.Z.
Department of Electronic Engineering, The Chinese University of Hong Kong
-
Pakhomov A.B.
Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology,
-
Sundaravel B.
Department of Electronic Engineering, The Chinese University of Hong Kong
-
Luo E.z.
Department Of Electronic Engineering The Chinese University Of Hong Kong
-
Sundaravel B.
Department Of Electronic Engineering The Chinese University Of Hong Kong
-
Sundaravel B.
Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology, Clear Water Bay
-
Xu J.B.
Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology, Clear Water Bay
著作論文
- Measuring the thickness and thickness uniformity of ultra-thin AlOx films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy (マルチメディアストレージ 第6回アジア情報記録技術シンポジウム〔英文〕)
- Measuring the thickness and thickness uniformity of ultra-thin AlO_x films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy