Sundaravel B. | Department Of Electronic Engineering The Chinese University Of Hong Kong
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概要
- Sundaravel B.の詳細を見る
- 同名の論文著者
- Department Of Electronic Engineering The Chinese University Of Hong Kongの論文著者
関連著者
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Wong C
Materials Characterization And Preparation Facility Hong Kong University Of Science And Technology
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Wong S.k.
Materials Characterization And Preparation Facility Hong Kong University Of Science And Technology
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Wong C.y.
Materials Characterization And Preparation Facility Hong Kong University Of Science And Technology
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Xu J.b.
Department Of Electronic Engineering The Chinese University Of Hong Kong
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Wilson I.h.
Department Of Electronic Engineering The Chinese University Of Hong Kong
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Pakhomov A
Materials Characterisation And Preparation Facility Hong Kong University Of Science And Technology
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Luo E.Z.
Department of Electronic Engineering, The Chinese University of Hong Kong
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Pakhomov A.B.
Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology,
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Sundaravel B.
Department of Electronic Engineering, The Chinese University of Hong Kong
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Luo E.z.
Department Of Electronic Engineering The Chinese University Of Hong Kong
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Sundaravel B.
Department Of Electronic Engineering The Chinese University Of Hong Kong
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Sundaravel B.
Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology, Clear Water Bay
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Xu J.B.
Materials Characterizatino and Preparation Facility Hong Kong University of Science and technology, Clear Water Bay
著作論文
- Measuring the thickness and thickness uniformity of ultra-thin AlOx films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy (マルチメディアストレージ 第6回アジア情報記録技術シンポジウム〔英文〕)
- Measuring the thickness and thickness uniformity of ultra-thin AlO_x films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy