Murakami A | Fuji Xerox Co. Ltd. Ebina Jpn

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Fuji Xerox Co. Ltd. Ebina Jpn | 論文

• Characterization of Directly Deposited Silicon Films Using Low-Energy Focused Ion Beam
• Characterization of Directly Deposited Silicon Films Using Low-Energy Focused Ion Beam
• Maskless Deposition of Au on GaAs by Low-Energy Focused Ion Beam
• Electrical Transport Properties of p-GaN
• Schottky Barrier on n-Type Al_Ga_N Grown by Organometalic Vapor Phase Epitaxy

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