Hsu Buo-chin | Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw
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Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw | 論文
- Local Thinning-Induced Oxide Nonuniformity Effect on the Tunneling Current of Ultrathin Gate Oxide(Semiconductors)
- The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebake : Semiconductors
- Room-Temperature Electroluminescence from Metal-Oxide-Silicon-Tunneling Diodes on (110) Substrates
- Boundary Scan Test Scheme for IP Core Identification via Watermarking(Programmable Logic, VLSI, CAD and Layout, Recent Advances in Circuits and Systems-Part 1)
- Process Optimization of Plasma-Enhanced Chemical Vapor Deposited Passivation Thin Films for Improving Nonvolatile Memory IC Performance