Lee Hong-lim | Department Of Ceramic Engineering School Of Material Science And Engineering College Of Engineering
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Department Of Ceramic Engineering School Of Material Science And Engineering College Of Engineering | 論文
- Simulation for thickness change of PRAM recording layer
- A Comparative Study between Total Thickness Variance and Site Flatness of Polished Silicon Wafer : Semiconductors
- Crystallization Properties of Ge1-xSbx Thin Films ($x = 0.58{\mbox{--}}0.88$)
- Influence of Silicon Doping on the Properties of Sputtered Ge2Sb2Te5 Thin Film
- Determination of Effective Nanoindentation Range for Hard (Ti,Al)N Thin Film