KUO Chi-Wein | Department of Electrical Engineering National Cheng Kung University
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概要
関連著者
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Su Yan-kuin
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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KUO Chi-Wein
Department of Electrical Engineering National Cheng Kung University
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Kuan Hrong
Department Of Electrical Engineering Nan-tai Institute Of Technology
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Kuo C‐w
National Cheng Kung Univ. Tainan Twn
著作論文
- BCl_3/Ar Plasma-Induced Surface Damage in GaInP/InGaAs/GaInP Quantum-Well High-Electron-Mobility Transistors
- Photoreflectance and C-V Measurement Investigations of Dry Etched Gate Recesses for GaInP/InGaAs/GaAs Pseudomorphic High Electron Mobility Transistors (HEMTs) Using BCl_3 /Ar Plasma