Ikarashi Nobuyuki | Device Platforms Research Laboratories Nec Corporation
スポンサーリンク
概要
関連著者
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Toda Akio
Device Platforms Research Laboratories Nec Corporation
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Ikarashi Nobuyuki
Device Platforms Research Laboratories Nec Corporation
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Fukai Toshinori
Advanced Device Development Division Nec Electronics Corporation
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Nakamura Hidetatsu
Advanced Device Development Division Nec Electronics Corporation
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TODA Akio
Device Platforms Research Laboratories, NEC Corporation
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NAKAMURA Hidetatsu
Advanced Device Development Division, NEC Electronics Corporation
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FUKAI Toshinori
Advanced Device Development Division, NEC Electronics Corporation
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IKARASHI Nobuyuki
Device Platforms Research Laboratories, NEC Corporation
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Ikarashi Nobuyuki
Device Platforms Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1189, Japan
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Nobuyuki Ikarashi
Device Platforms Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1189, Japan
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Fukai Toshinori
Advanced Device Development Division, NEC Electronics Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1189, Japan
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Toda Akio
Device Platforms Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1189, Japan
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Akio Toda
Device Platforms Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1189, Japan
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Nakamura Hidetatsu
Advanced Device Development Division, NEC Electronics Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1189, Japan
著作論文
- Channel Strain in Advanced CMOSFETs Measured Using Nano-Beam Electron Diffraction
- Nondestructive Warpage Measurements of LSI Chips in a Stacked System in Package by Using High-Energy X-ray Diffraction
- Channel Strain in Advanced Complementary Metal–Oxide–Semiconductor Field Effect Transistors Measured Using Nano-Beam Electron Diffraction