Graeff Carlos | Walter Schottky Institut Technische Universitat Munchen
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概要
関連著者
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Stutzmann Martin
Walter Schottky Institut
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Kawachi Genshiro
Hitachi Research Laboratory Hitachi Ltd.
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Brandt Martin
Walter Schottky Institut Technische Universitat Munchen
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Graeff Carlos
Walter Schottky Institut Technische Universitat Munchen
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GRAEFF Carlos
Walter Schottky Institut, Technische Universitat Munchen
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BRANDT Martin
Walter Schottky Institut, Technische Universitat Munchen
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Brandt Martin
Walter Schottky Institut, Technische Universität München, Am Coulombwall, Garching, 85748, Germany
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Kawachi Genshiro
Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Ohmika, Hitachi, Ibaraki 319-12, Japan
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Stutzmann Martin
Walter Schottky Institut, Technische Universität München, Am Coulombwall, Garching, 85748, Germany
著作論文
- Defects in Si Thin-Film Transistors Studied by Spin-Dependent Transport
- Saturation Measurements of Electrically Detected Magnetic Resonance in Hydrogenated Amorphous Silicon Based Thin-Film Transistors