Obien Marie | Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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概要
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn | 論文
- Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on τ^k-Notation(Complexity Theory)
- D-10-18 An Approach to Temperature Control During VLSI Test
- Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors
- Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability(Dependable Computing)
- Non-scan Design for Single-Port-Change Delay Fault Testability (特集:システムLSI設計とその技術)