Tsuji Naoki | Memory Ic Div. Mitsubishi Electric Corp.

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概要

• 同名の論文著者
• Memory Ic Div. Mitsubishi Electric Corp.の論文著者

関連著者

• Kinoshita K

  Ntt Basic Research Laboratory

• Kobayashi K

  Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative

• Arima Hideaki

  Ulsi Development Center Mitsubishi Electric Corp.

• Wake Setsuo

  Ulsi Development Center Mitsubishi Electric Corp.

• KUROKAWA Hisayoshi

  Department of Electrical and Electronic Engineering, Ehime University

• OGATA Tamotsu

  ULSI Laboratory, Mitsubishi Electric Corporation

• KUROKAWA Hiroshi

  Advanced Technology R&D Center, Mitsubishi Electric Corporation

• Kobayashi K

  Kobe Steel Ltd. Kobe Jpn

• Kishio Kohji

  Department Of Applied Chemistry University Of Tokyo:sorst Japan Science And Technology Corporation (

• Kamigaki K

  College Of Liberal Arts Toyama University

• Kinoshita K

  Ntt Basic Research Laboratories

• Ogata Toshihiro

  Department Of Electronic Engineering Faculty Of Science And Engineering Saga University

• Kudoh Kazuhide

  Department Of Applied Physics Tokyo University Of Science

• INOUE Masao

  ULSI Development Center, Mitsubishi Electric Corp.

• NAKAMURA Tadashi

  Ryoden Semiconductor System Engineering Corp.

• TSUJI Naoki

  Memory IC Div., Mitsubishi Electric Corp.

• KOBAYASHI Kiyoteru

  Memory IC Div., Mitsubishi Electric Corp.

• KAWASE Kazuo

  Advanced Technology R&D Center, Mitsubishi Electric Corp.

• KANEOKA Tatsunori

  ULSI Development Center, Mitsubishi Electric Corp.

• Kunihiro Kazuaki

  Optoelectronics And High Frequency Device Research Laboratories Nec Corporation

• Kurokawa Hisayoshi

  Department Of Electrical And Electronic Engineering Ehime University

• Kitazawa Koichi

  Ntt Basic Research Laboratories

• Kurihara K

  Ntt Basic Research Laboratories

• Ogata T

  Ulsi Development Center Mitsubishi Electric Corp.

• Kurokawa Hiroshi

  Advanced Technology R&d Center Mitsubishi Electric Corp

• Kobayashi Keiji

  Toshiba Research And Development Center

• Kawase Kazuo

  Advanced Technology R&d Center Mitsubishi Electric Corp.

• Kurokawa H

  Department Of Electrical And Electronic Engineering Ehime University

• Kaneoka Tatsunori

  Ulsi Development Center Mitsubishi Electric Corp.

• Tsuji Naoki

  Memory Ic Div. Mitsubishi Electric Corp.

• Inoue Masao

  Ulsi Development Center Mitsubishi Electric Corp.

• Ogata Tamotsu

  ULSI Development Center, Mitsubishi Electric Corp.

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著作論文

• Impact of Thermal Nitridation on Microscopic Stress-Induced Leakage Current in Sub-10-nm Silicon Dioxides

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