Mun Jong-kuk | Rf Circuit Group It Convergence And Components Laboratory Electronics And Telecommunications Researc
スポンサーリンク
概要
- MUN Jae-Kyoungの詳細を見る
- 同名の論文著者
- Rf Circuit Group It Convergence And Components Laboratory Electronics And Telecommunications Researcの論文著者
Rf Circuit Group It Convergence And Components Laboratory Electronics And Telecommunications Researc | 論文
- Comparative Study of DC and Microwave Characteristics of 0.12μm T-Shaped Gate AlGaAs/InGaAs/GaAs PHEMTs Using a Hybrid and Conventional E-beam Lithography Process
- Influence of T-gate shape on the device characteristics in SiN-assisted 0.12um AlGaAs/InGaAs PHEMT
- A Comparative Study on the DC, Microwave Characteristics of 0.12μm Double-Recessed Gate AlGaAs/InGaAs/GaAs PHEMTs Using a Dielectric Assisted Process
- 0.12μm Gate Length T-Shaped AlGaAs/InGaAs/GaAs Pseudomorphic High-Electron-Mobility Transistors Fabricated Using a Plasma-Enhanced Chemical Vapor Deposited Silicon-Nitride-Assisted Process
- PdGe-Based Ohmic Contact on n-GaAs with Highly and Poorly Doped Layers