Usui S | Research Center Sony Corporation
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概要
Research Center Sony Corporation | 論文
- Characterization and Control of Domain Structure in SrBi_2Ta_2O_9 Thin Films by Scanning Force Microscopy
- Effect of sputtering conditions on the exchange-biasing of NiFe/IrMn layers prepared by UHV-ICP sputtering system
- Effect of sputtering conditions on the exchange-biasing of NiFe/IrMn layers prepared by UHV-ICP sputtering system
- A New Write Compensation Pulse for High-Density Recording on Magnetically Induced Super Resolution (MSR) Media
- Primary Structure and Catalytic Properties of a Cold-active Esterase from a Psychrotroph, Acinetobacter sp. Strain No.6. Isolated from Siberian Soil(Biochemistry & Molecular Biology)