INOUE Shoji | TDI Co.Ltd.in the A&E Technology Center, NEC Corporation
スポンサーリンク
概要
関連著者
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INOUE Shoji
TDI Co.Ltd.in the A&E Technology Center, NEC Corporation
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Inoue Shoji
Tdi Co. Ltd.
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Matsumoto Chika
A&e Technology Center Nec Corporation
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Nikawa Kiyoshi
A&e Technology Center Nec Corporation
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Nikawa Kiyoshi
The A&e Technology Center Nec Corporation
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NIKAWA Kiyoshi
A&E Technology Center, NEC Corporation
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Matsumoto Chika
A&E Technology Center NEC Corporation
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Inoue Shoji
Tdi Co.ltd.in The A&e Technology Center Nec Corporation
著作論文
- Highly Sensitive OBIRCH System for Fault Localization and Defect Detection(Special Issue on Test and Diagnosis of VLSI)
- Novel Method for Defect Detection in Al Stripes by Means of Laser Beam Heating and Detection of Changes in Electrical Resistance