Huang H‐s | Institute Of Mechatronics Engineering National Taipei University Of Technology

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• Huang Heng-Shengの詳細を見る
• 同名の論文著者
• Institute Of Mechatronics Engineering National Taipei University Of Technologyの論文著者

Institute Of Mechatronics Engineering National Taipei University Of Technology | 論文

• The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
• The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
• DC Hot Carrier Reliability at Elevated Temperatures for nMOSFETs Using 0.13μm Technology
• Mismatches under the Impact of Hot Carrier Stress in 0.15μm Technology
• Improvement of Ultra-Thin 3.3nm Thick Oxide for Co-Salicide Process Using NF3 Annealed Poly-Si Gate

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