Pu Jing | Department Of Ece National University Of Singapore
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概要
関連著者
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Cho Byung
Department Of Eecs Kaist
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He Wei
Department Of Ece National University Of Singapore
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Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
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Pu Jing
Department of ECE, National University of Singapore
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Pu Jing
Department Of Ece National University Of Singapore
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He Wei
Department of Cardiothoracic Surgery, Zhongda Hospital, Medical School, Southeast University
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He Wei
Department of ECE, National University of Singapore
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Cho Byung
Department of EECS,KAIST
著作論文
- High-K Dielectrics for Charge Trap-type Flash Memory Application(Session2: Silicon Devices I)
- High-K Dielectrics for Charge Trap-type Flash Memory Application(Session2: Silicon Devices I)