守山 実希 | The Ritsumeikan Trust
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概要
The Ritsumeikan Trust | 論文
- Growth and Microstructure of Epitaxial Ti3SiC2 Contact Layers on SiC
- Resistivity Reduction and Adhesion Increase Induced by Surface and Interface Segregation of Ti Atoms in Cu(Ti) Alloy Films on Glass Substrates
- Effects of Dielectric-Layer Composition on Growth of Self-Formed Ti-Rich Barrier Layers in Cu(1at% Ti)/Low-k Samples
- Self-Formation of Ti-rich Interfacial Layers in Cu(Ti) Alloy Films
- Structure Analyses of Ti-Based Self-Formed Barrier Layers