Sanada Masaru | Analysis Technology Development Division Nec Electronics Corporation

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概要

• SANADA Masaruの詳細を見る
• 同名の論文著者
• Analysis Technology Development Division Nec Electronics Corporationの論文著者

関連著者

• Sanada Masaru

  Analysis Technology Development Division Nec Electronics Corporation

• Sanada M

  Nec Electronics Corp. Kawasaki‐shi Jpn

著作論文

• A CAD-Based Approach to Fault Diagnosis of CMOS LSI with Single Fault Using Abnormal Iddq (Special Section on VLSI Design and CAD Algorithms)
• Layout-Based Detection Technique of Line Pairs with Bridging Fault Using I_(Fault Detection)(Test and Verification of VLSI)

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