Lim Kwan‐yong | Hynix Semiconductor Inc. Kyoungki‐do Kor
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概要
Hynix Semiconductor Inc. Kyoungki‐do Kor | 論文
- Platinum Hillocks in Pt/Ti Film Stacks Deposited on Thermally Oxidized Si Substrate : Semiconductors
- Characteristics of TaO_xN_y Gate Dielectric with Improved Thermal Stability
- Ohmic Contact Properties of Tungsten Plug and Ferroelectric Properties of (Bi,La)_4Ti_3O_ Thin Film in Stacked Capacitor Structure
- Electrical Properties of Bi_LaxTi_3O_ Ferroelectric Thin Films Prepared by Metalorganic Decomposition Method
- Stacked Pt/SrBi_2Ta_Nb_xO_9/Pt/IrO_x/Ir Capacitor on Poly Plug(Semiconductors)