LIN Jung-Chun | Department of Electronics Engineering, National Chiao Tung University
スポンサーリンク
概要
関連著者
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Lei Tan-fu
Department Of Electronic Engineering National Chiao Tung University
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Yeh Wen-kuan
Electrical Engineering Department National University Of Kaohsiung
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LIN Jung-Chun
Department of Electronics Engineering, National Chiao Tung University
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Lei Tan-Fu
Department of Electronics Engineering, National Chiao Tung University, Hsin-Chu, Taiwan
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Yeh Wen-Kuan
Electrical Engineering Department, National University of Kaohsiung, No. 700, Kaohsiung University Rd., Nan-Tzu Dist., Kaohsiung, Taiwan
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Lin Jung-Chun
Department of Electronics Engineering, National Chiao Tung University, Hsin-Chu, Taiwan
著作論文
- Efficient Improvement of Hot-Carrier-Induced Device's Degradation for Sub-0.1μm Complementary Metal-Oxide-Semiconductor Field-Effect-Transistor Technology
- Efficient Improvement of Hot-Carrier-Induced Device’s Degradation for Sub-0.1 μm Complementary Metal-Oxide-Semiconductor Field-Effect-Transistor Technology