YOON Youngchang | Seoul National Univ. Dept. of EE
スポンサーリンク
概要
関連著者
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Shin Hyungcheol
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Hochul
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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LEE Hochul
Seoul National Univ. Dept. of EE
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YOON Youngchang
Seoul National Univ. Dept. of EE
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SHIN Hyungcheol
Seoul National Univ. Dept. of EE
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Yoon Youngchang
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Shin Hyungcheol
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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JEON Jongwook
Seoul National Univ. Dept. of EE
著作論文
- Analysis of Random Telegraph Signal Noise in Dual and Single Oxide Device And Its Application to CMOS Image Sensor Readout Circuit
- FN stess induced degradation on random telegraph signal noise in deep submicron NMOSFETs (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- FN stess induced degradation on random telegraph signal noise in deep submicron NMOSFETs (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Accurate Extraction of the Trap Depth From RTS Noise Data By including Poly Depletion Effect and Surface Potential Variation in MOSFETs(Session 7A Silicon Devices IV,AWAD2006)
- Accurate Extraction of the Trap Depth From RTS Noise Data By including Poly Depletion Effect and Surface Potential Variation in MOSFETs(Session 7A Silicon Devices IV,AWAD2006)