Suzuki Joe | Yokohama R & D Laboratories The Furukawa Electric Co. Ltd.
スポンサーリンク
概要
関連著者
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Yoshida Seikoh
Yokohama R & D Laboratories The Furukawa Electric Co. Ltd.
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Suzuki Joe
Yokohama R & D Laboratories The Furukawa Electric Co. Ltd.
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Suzuki Joe
Yokohama R&d Laboratories The Furukawa Electric Co. Ltd.
著作論文
- Characterization of a GaN Bipolar Junction Transistor after Operation at 300 for over 300 h
- Reliability of GaN Metal Semiconductor Field-Effect Transistor at High Temperature