Hirose Yutaka | Texas Instruments Tsukuba Research And Development Center Ltd.
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概要
関連著者
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MATSUMURA Mieko
Texas Instruments Tsukuba R & D Center
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Hirose Yutaka
Texas Instruments Tsukuba Research And Development Center Ltd.
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MATSUMURA Mieko
Texas Instruments Tsukuba Research and Development Center, Ltd.
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HIROSE Yutaka
Texas Instruments Tsukuba Research and Development Center, Ltd.
著作論文
- Negative-Capacitance Effect in Forward-Biased Metal Oxide Semiconductor Tunnel Diodes(MOSTD)
- Extraction of the Capacitance of a Metal Oxide Semiconductor Tunnel Diode (MOSTD) Biased in Accumulation