PARK Jin-Hong | Samsung Electronics Co., Ltd.
スポンサーリンク
概要
関連著者
-
Cha Byung-cheol
Samsung Electronics Co. Ltd.
-
Kim Soon
Samsung Electronics Co. Ltd.
-
Choi Sung-woon
Samsung Electronics Co. Ltd.
-
PARK Jin-Hong
Samsung Electronics Co., Ltd.
-
KIM Seong-Yoon
Samsung Electronics Co., Ltd.
-
PARK Jong
Department of Internal Medicine, Chonnam National University Hospital
-
Lee Dong
Samsung Heavy Industries Co. Ltd. Koje Shipyard
-
Lee Dong
Samsung Electronics Co. Ltd.
-
Park Jong
Department Mathematics Pusan National University
-
Kim Soon
Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea
-
Park Jin-Hong
Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea
-
Choi Sung-Woon
Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea
-
Park Jong
Department of Photonic Engineering, Chosun University, 375 Seosuk-dong, Dong-gu, Gwangju 501-759, Korea
-
Kim Seong-Yoon
Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea
-
Cha Byung-Cheol
Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea
著作論文
- Correction of Critical Dimension Uniformity on a Wafer by Controlling Back-Surface Transmittance Distribution of a Photomask
- Correction of Critical Dimension Uniformity on a Wafer by Controlling Back-Surface Transmittance Distribution of a Photomask