Choi Sung-Woon | Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea

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概要

• Choi Sung-Woonの詳細を見る
• 同名の論文著者
• Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Koreaの論文著者

関連著者

• Cha Byung-cheol

  Samsung Electronics Co. Ltd.

• Kim Soon

  Samsung Electronics Co. Ltd.

• Lee Dong

  Samsung Electronics Co. Ltd.

• Choi Sung-woon

  Samsung Electronics Co. Ltd.

• PARK Jin-Hong

  Samsung Electronics Co., Ltd.

• KIM Seong-Yoon

  Samsung Electronics Co., Ltd.

• Park Jong

  Department Mathematics Pusan National University

• Kim Soon

  Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea

• Park Jin-Hong

  Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea

• Choi Sung-Woon

  Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea

• Park Jong

  Department of Photonic Engineering, Chosun University, 375 Seosuk-dong, Dong-gu, Gwangju 501-759, Korea

• Kim Seong-Yoon

  Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea

• Cha Byung-Cheol

  Samsung Electronics Co., Ltd., San No. 24 Nongseo-Ri, Kiheung-Eup, Yongin, Kyunggi-Do 449-711, Korea

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著作論文

• Correction of Critical Dimension Uniformity on a Wafer by Controlling Back-Surface Transmittance Distribution of a Photomask

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