KAZUMA Kensuke | Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National Universit
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概要
- 同名の論文著者
- Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National Universitの論文著者
関連著者
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TADA Kunio
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National Universit
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KAZUMA Kensuke
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National Universit
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NOH Joo-Hyong
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National Universit
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NOH Joo-Hyong
Yokogawa Electric Corporation
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Arakawa Taro
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National Universit
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多田 邦雄
金沢工業大学大学院
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Arakawa Taro
Division Of Electrical And Computer Engineering Faculty Of Engineering Yokohama National University
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KUROSAWA Naoki
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National Universit
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Kurosawa Naoki
Division Of Electrical And Computer Engineering Faculty Of Engineering Yokohama National University
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Kurosawa Naoki
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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Arakawa Taro
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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Tada Kunio
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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Kazuma Kensuke
Division of Electrical and Computer Engineering, Faculty of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
著作論文
- Influence of One Monolayer Thickness Variation in GaAs/AlGaAs Five-Layer Asymmetric Coupled Quantum Well upon Electrorefractive Index Change
- Influence of One Monolayer Thickness Variation in GaAs/AlGaAs Five-Layer Asymmetric Coupled Quantum Well upon Electrorefractive Index Change