Huang K‐c | Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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- Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang Universityの論文著者
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University | 論文
- Electrical and Optical Characteristics of an a-Si:H/c-Si Heterojunction Switch
- A Comparison of Behaviors between Hydrogenated/Unhydrogenated Polysilicon Thin Film Transistors under Electric Stress
- Improvement on Fluorine Effect under High Field Stress in Tungsten-Polycide Gated Metal-Oxide-Semiconductor Field-Effect Transistor with Oxynitride and/or Reoxidized-Oxynitride Gate Dielectric
- Hot-Carrier-Induced Degradation on 0.1 μm Partially Depleted Silicon-On-Insulator Complementary Metal-Oxide-Semiconductor Field-Effect-Transistor
- Effects of Tungsten Polycide Process and Post-Polyoxidation Rapid Thermal Process on Electrical Characteristics of Thin Polysilicon Oxide